Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11733282 | Probe for non-intrusively detecting imperfections in a test object | Laurent Bianchi, John Enderby, Mark Bowes, Dawood Parker | 2023-08-22 |
| 11366150 | Probe for non-intrusively detecting imperfections in a test object | Laurent Bianchi, John Enderby, Mark Bowes, Dawood Parker | 2022-06-21 |
| 10876989 | Method for non-intrusively detecting imperfections in a test object | Laurent Bianchi, John Enderby, Mark Bowes, Dawood Parker | 2020-12-29 |
| 9528965 | System and a method of inspecting a rotary part to be monitored that is arranged in a mechanical member | Philippe Beck, André Baixas, Eric Biletta, Olivier Molinas | 2016-12-27 |