Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11733282 | Probe for non-intrusively detecting imperfections in a test object | Laurent Bianchi, Sebastien Bernier, Mark Bowes, Dawood Parker | 2023-08-22 |
| 11366150 | Probe for non-intrusively detecting imperfections in a test object | Laurent Bianchi, Sebastien Bernier, Mark Bowes, Dawood Parker | 2022-06-21 |
| 10876989 | Method for non-intrusively detecting imperfections in a test object | Laurent Bianchi, Sebastien Bernier, Mark Bowes, Dawood Parker | 2020-12-29 |
| 8970843 | Optical assembly and method for determining analyte concentration | Dawood Parker | 2015-03-03 |