MM

Michael McTigue

AT Agilent Technologies: 11 patents #146 of 3,411Top 5%
KT Keysight Technologies: 8 patents #17 of 567Top 3%
Overall (All Time): #230,995 of 4,157,543Top 6%
19
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12372551 Voltage probe device with adjustable bias Hal Robert Paver 2025-07-29
11644488 DC power rail probes and measurement methods Edward Vernon Brush, IV 2023-05-09
10914756 Miniature test probe Jason Swaim, Daniel A. Garcia 2021-02-09
9857392 Single ended test probe having ground and signal tips Jason Swaim 2018-01-02
9797927 Browser probe 2017-10-24
9459290 Oscilloscope system and method for simultaneously displaying zoomed-in and zoomed-out waveforms Kenneth W. Johnson, Edward Vernon Brush, IV 2016-10-04
9423422 Oscilloscope probe having output clamping circuit Edward Vernon Brush, IV, Kenneth W. Johnson 2016-08-23
9316669 Measurement probe providing different levels of amplification for signals of different magnitude Kenneth W. Johnson, Edward Vernon Brush, IV 2016-04-19
7102370 Compliant micro-browser for a hand held probe James E. Cannon, David Dascher, Stuart Hall 2006-09-05
7005868 Apparatus and method for canceling DC errors and noise generated by ground shield current in a probe 2006-02-28
6931331 Measurement interface optimized for both differential and single-ended inputs 2005-08-16
6864694 Voltage probe 2005-03-08
6856126 Differential voltage probe Kenneth McClellan Rush, Bob Kimura, Michael J. Lujan 2005-02-15
6831452 Systems and methods for wideband single-end probing of variabily spaced probe points 2004-12-14
6828768 Systems and methods for wideband differential probing of variably spaced probe points 2004-12-07
6806697 Apparatus and method for canceling DC errors and noise generated by ground shield current in a probe 2004-10-19
6725172 Systems and methods for tagging measurement values Allen Montijo 2004-04-20
6704673 System and method for improving linearity and reducing digitization artifacts in a data analysis system Allen Montijo 2004-03-09
6704670 Systems and methods for wideband active probing of devices and circuits in operation 2004-03-09