Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8110801 | Layered scanning charged particle microscope package for a charged particle and radiation detector | Scott W. Indermuehle, James Spallas, Lawrence P. Muray | 2012-02-07 |
| 8003952 | Integrated deflectors for beam alignment and blanking in charged particle columns | Lawrence P. Muray, James Spallas | 2011-08-23 |