Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7239160 | Method of electrical testing of an integrated circuit with an electrical probe | James Golden, Calvin Lee Schumacher, Philip William Seitzer, Steven V. Stang | 2007-07-03 |
| 7132840 | Method of electrical testing | James Golden, Calvin Lee Schumacher, Philip William Seitzer, Steven V. Stang | 2006-11-07 |
| 7005880 | Method of testing electronic wafers having lead-free solder contacts | Brian Lee Buss, Robert D. Ickes | 2006-02-28 |