Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7239160 | Method of electrical testing of an integrated circuit with an electrical probe | James Golden, Wayne Rademacher, Calvin Lee Schumacher, Philip William Seitzer | 2007-07-03 |
| 7132840 | Method of electrical testing | James Golden, Wayne Rademacher, Calvin Lee Schumacher, Philip William Seitzer | 2006-11-07 |
| 6430047 | Standardized test board for testing custom chips | Earl E. Wentzel, Brant R. Gourley, Gregory A. King, Paul Cisewski, Gregory P. Micko +1 more | 2002-08-06 |