YK

Yoshinobu Kagawa

AD Advantest: 2 patents #465 of 1,193Top 40%
TI Texas Instruments: 1 patents #7,357 of 12,488Top 60%
Overall (All Time): #2,217,073 of 4,157,543Top 55%
2
Patents All Time

Issued Patents All Time

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6434063 Method of repairing semiconductor memory, electron-beam memory repairing apparatus and redundancy memory circuit to which the method of repairing semiconductor memory is applicable Naoki Nishio, Hideyuki Fukuhara, Yoichi Miyai 2002-08-13
5985677 Method of repairing semiconductor memory, electron-beam memory repairing apparatus and redundancy memory circuit to which the method of repairing semiconductor memory is applicable Naoki Nishio, Hideyuki Fukuhara, Yoichi Miyai 1999-11-16