Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7382117 | Delay circuit and test apparatus using delay element and buffer | Masakatsu Suda | 2008-06-03 |
| 7107166 | Device for testing LSI to be measured, jitter analyzer, and phase difference detector | — | 2006-09-12 |