Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11782072 | Test arrangement for testing high-frequency components, particularly silicon photonics devices under test | José Moreira, Zhan Zhang, Hubert Werkmann, Fabio Pizza | 2023-10-10 |
| 11561242 | Test arrangement for testing high-frequency components, particularly silicon photonics devices under test | José Moreira, Zhan Zhang, Hubert Werkmann, Fabio Pizza | 2023-01-24 |
| 8275592 | Joint inversion of time domain controlled source electromagnetic (TD-CSEM) data and further data | Andrea Lovatini, Michael D. Watts, Diego Rovetta, Giancarlo Bernasconi | 2012-09-25 |