Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11782072 | Test arrangement for testing high-frequency components, particularly silicon photonics devices under test | José Moreira, Zhan Zhang, Hubert Werkmann, Paolo Mazzucchelli | 2023-10-10 |
| 11561242 | Test arrangement for testing high-frequency components, particularly silicon photonics devices under test | José Moreira, Zhan Zhang, Hubert Werkmann, Paolo Mazzucchelli | 2023-01-24 |