MO

Masataka Onozawa

AD Advantest: 10 patents #85 of 1,193Top 8%
Overall (All Time): #493,983 of 4,157,543Top 15%
10
Patents All Time

Issued Patents All Time

Showing 1–10 of 10 patents

Patent #TitleCo-InventorsDate
11573267 Electronic component handling apparatus and electronic component testing apparatus Yuki Koba 2023-02-07
11353502 Electronic component handling apparatus and electronic component testing apparatus Mitsunori Aizawa, Aritomo Kikuchi 2022-06-07
10324127 Electronic component handling apparatus, electronic component testing apparatus, and electronic component testing method Yasuyuki Kato, Keisuke Nitta 2019-06-18
10297043 Detector for detecting position of IC device and method for the same Aritomo Kikuchi 2019-05-21
9784789 Handler apparatus that conveys a device under test to a test socket and test apparatus including the handler apparatus Aritomo Kikuchi, Tsuyoshi Yamashita, Mitsunori Aizawa, Hiromitsu Horino, Yuya Yamada 2017-10-10
9658287 Handler apparatus, adjustment method of handler apparatus, and test apparatus Tsuyoshi Yamashita, Mitsunori Aizawa, Hiromitsu Horino, Yuya Yamada 2017-05-23
9606170 Handler apparatus that conveys a device under test to a test socket and test apparatus that comprises the handler apparatus Tsuyoshi Yamashita, Mitsunori Aizawa, Hiromitsu Horino, Yuya Yamada 2017-03-28
9453874 Actuator, handler apparatus and test apparatus Aritomo Kikuchi, Yuya Yamada 2016-09-27
9316686 Handler and test apparatus Hiromitsu Horino 2016-04-19
9024648 Handler for conveying a plurality of devices under test to a socket for a test and test apparatus Hiromitsu Horino 2015-05-05