Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12422472 | Temperature control device, electronic component handling apparatus, electronic component test apparatus, and DUT temperature control method | — | 2025-09-23 |
| 11496227 | Electronic component handling apparatus, electronic component testing apparatus, and socket | Natsuki Shiota | 2022-11-08 |
| 11353502 | Electronic component handling apparatus and electronic component testing apparatus | Masataka Onozawa, Mitsunori Aizawa | 2022-06-07 |
| 11287468 | Electronic component handling apparatus, electronic component testing apparatus, and socket | Natsuki Shiota | 2022-03-29 |
| 10823788 | Magnetic sensor testing device | Yuki Endo, Shigeo Nakamura | 2020-11-03 |
| 10297043 | Detector for detecting position of IC device and method for the same | Masataka Onozawa | 2019-05-21 |
| 9784789 | Handler apparatus that conveys a device under test to a test socket and test apparatus including the handler apparatus | Tsuyoshi Yamashita, Mitsunori Aizawa, Hiromitsu Horino, Yuya Yamada, Masataka Onozawa | 2017-10-10 |
| 9778283 | Electronic component handling apparatus, electronic component testing apparatus, and electronic component testing method | — | 2017-10-03 |
| 9453874 | Actuator, handler apparatus and test apparatus | Yuya Yamada, Masataka Onozawa | 2016-09-27 |
| 8941729 | Electronic component handling apparatus, electronic component testing apparatus, and electronic component testing method | Hiroto Nakamura | 2015-01-27 |
| 8294759 | Calibration method of electronic device test apparatus | Hiroto Nakamura, Jinji Tokita, Katsuhiko Ikeda | 2012-10-23 |
| 7471819 | Position detecting apparatus, a position detecting method and an electronic component carrying apparatus | Masayoshi Ichikawa | 2008-12-30 |