Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6417682 | Semiconductor device testing apparatus and its calibration method | Toshikazu Suzuki, Hiroyuki Nagai, Noriyoshi Kozuka, Yukio Ishigaki, Shigeru Matsumura +3 more | 2002-07-09 |
| 6400193 | High speed, high current and low power consumption output circuit | — | 2002-06-04 |
| 6242966 | Leakage current correcting circuit | — | 2001-06-05 |
| 5945822 | Programmable load circuit | — | 1999-08-31 |
| 5781059 | Driver circuit for semiconductor test system | — | 1998-07-14 |