Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6417682 | Semiconductor device testing apparatus and its calibration method | Toshikazu Suzuki, Hiroyuki Nagai, Noriyoshi Kozuka, Yukio Ishigaki, Shigeru Matsumura +3 more | 2002-07-09 |
| 5862088 | Apparatus and method for testing a memory | Hiroshi Takemoto | 1999-01-19 |
| 4878743 | Automotive mirror using electrochromic element | Toyoshi Aikawa | 1989-11-07 |