Issued Patents All Time
Showing 26–50 of 58 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8423294 | High resolution linear analysis of polymers | Mark Nadel, Eugene Y. Chan, Rudolf Gilmanshin | 2013-04-16 |
| 7708884 | Process for aerobic-thermophilic stabilization and disinfection of sludge | Leonhard Fuchs | 2010-05-04 |
| 7531093 | Process for the aerobic-thermophilic stabilization and disinfection of sludge | Leonhard Fuchs | 2009-05-12 |
| 7402422 | Systems and methods for detecting and analyzing polymers | John E. Harris, Ray Meyer | 2008-07-22 |
| 7371520 | Methods and apparati using single polymer analysis | Xiaojian (David) Zhao, Jeffrey D. Randall, Bijit Kundu, Jessica Kesty, Steve R. Gullans +1 more | 2008-05-13 |
| 7351538 | Systems and methods for detecting and analyzing polymers | John E. Harris, Ray Meyers | 2008-04-01 |
| 7282330 | Methods and apparati using single polymer analysis | Xiaojian (David) Zhao, Jeffrey D. Randall, Bijit Kundu, Jessica Kesty, Steven R. Gullans +2 more | 2007-10-16 |
| 6795198 | Method and device for measuring thin films and semiconductor substrates using reflection mode geometry | Matthew Banet, Keith A. Nelson, John A. Rogers | 2004-09-21 |
| 6734982 | Method and device for measuring the thickness of thin films near a sample's edge and in a damascene-type structure | Matthew Banet, John A. Rogers | 2004-05-11 |
| 6348967 | Method and device for measuring the thickness of opaque and transparent films | Keith A. Nelson, John A. Rogers, Matthew Banet, John Hanselman | 2002-02-19 |
| 6256100 | Method and device for measuring the thickness of thin films near a sample's edge and in a damascene-type structure | Matthew Banet, John A. Rogers | 2001-07-03 |
| 6188478 | Method and apparatus for film-thickness measurements | Michael A. Joffe, Matt Banet | 2001-02-13 |
| 6175421 | Method and apparatus for measuring material properties using transient-grating spectroscopy | John A. Rogers, Matthew Banet | 2001-01-16 |
| 6118533 | Method and apparatus for measuring the concentration of ions implanted in semiconductor materials | Matthew Banet, John A. Rogers | 2000-09-12 |
| 6081330 | Method and device for measuring the thickness of opaque and transparent films | Keith A. Nelson, John A. Rogers, Matthew Banet, John Hanselman | 2000-06-27 |
| 6075602 | Method and apparatus for measuring material properties using transient-grating spectroscopy | John A. Rogers, Matthew Banet | 2000-06-13 |
| 6069703 | Method and device for simultaneously measuring the thickness of multiple thin metal films in a multilayer structure | Matthew Banet, John A. Rogers, Keith A. Nelson, Timothy F. Crimmins, Alexei Maznev | 2000-05-30 |
| 6052185 | Method and apparatus for measuring the concentration of ions implanted in semiconductor materials | Matthew Banet, John A. Rogers | 2000-04-18 |
| 6016202 | Method and apparatus for measuring material properties using transient-grating spectroscopy | John A. Rogers, Matthew Banet | 2000-01-18 |
| 5958202 | Capillary electrophoresis enzyme immunoassay | Fred E. Regnier, Xian Yao, Todd Taylor, Dieter R. Schmalzing, Lance B. Koutny +1 more | 1999-09-28 |
| 5948231 | Compositions, methods and apparatus for ultrafast electroseparation analysis | Wassim A. Nashabeh, Dieter R. Schmalzing | 1999-09-07 |
| 5812261 | Method and device for measuring the thickness of opaque and transparent films | Keith A. Nelson, John A. Rogers, Matthew Banet, John Hanselman | 1998-09-22 |
| 5757482 | Module for optical detection in microscale fluidic analyses | Lance B. Koutny | 1998-05-26 |
| 5630924 | Compositions, methods and apparatus for ultrafast electroseparation analysis | Wassim A. Nashabeh, Dieter R. Schmalzing | 1997-05-20 |
| 5348658 | Process for effecting capillary electrophoresis | Michael Merion | 1994-09-20 |