DK

Daisuke Kajiwara

TL Tokyo Electron Limited: 1 patents #256 of 785Top 35%
Overall (2025): #412,297 of 469,880Top 90%
1
Patents 2025

Issued Patents 2025

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
12413832 Substrate inspection apparatus, substrate inspection method, and recording medium Tadashi Nishiyama, Hiroshi Tomita 2025-09-09