Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12221229 | System and method for measuring localized characteristics of a transparency | James W. Brown, JR., John Joseph Haake, Xue Liu, Anthony C. Roberts, Matthew M. Thomas +1 more | 2025-02-11 |