Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12276698 | Testing system and testing method | — | 2025-04-15 |
| 12224179 | Metal heterojunction structure with capping metal layer | Yi-Sheng Lin, Chi-Jen Liu, Chi-Hsiang Shen, Chun-Wei Hsu, Chia-Wei Ho +4 more | 2025-02-11 |