Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12387318 | Hot spot defect detecting method and hot spot defect detecting system | Chien-Huei Chen, Pei-Chao Su, Xiaomeng Chen, Chan-Ming Chang, Shih-Yung Chen +6 more | 2025-08-12 |
| 12243218 | Method and system for scanning wafer | Pei-Hsuan Lee, Chien-Hsiang Huang, Kuan-Hsin Chen, Chun-Chieh Chin | 2025-03-04 |