Issued Patents 2025
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12333227 | Machine-learning-based design-for-test (DFT) recommendation system for improving automatic test pattern generation (ATPG) quality of results (QoR) | Apik A. Zorian, Suryanarayana Duggirala, Mahilchi Milir Vaseekar Kumar, Basim Mohammed Issa Shanyour | 2025-06-17 |
| 12282063 | Scan chain formation for improving chain resolution | Emil Gizdarski | 2025-04-22 |