Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12333227 | Machine-learning-based design-for-test (DFT) recommendation system for improving automatic test pattern generation (ATPG) quality of results (QoR) | Apik A. Zorian, Fadi Maamari, Suryanarayana Duggirala, Mahilchi Milir Vaseekar Kumar | 2025-06-17 |