Issued Patents 2025
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12399218 | PORs testing in multiple power domain devices | Mayankkumar Hareshbhai Niranjani, Gourav Garg | 2025-08-26 |
| 12366605 | Area, cost, and time-effective scan coverage improvement | Umesh Chandra Srivastava, Shiv Kumar Vats, Manish Sharma | 2025-07-22 |
| 12360161 | Scan circuit and method | Shiv Kumar Vats, Tripti Gupta | 2025-07-15 |
| 12345764 | Test pattern generation using multiple scan enables | Shiv Kumar Vats, Umesh Chandra Srivastava | 2025-07-01 |
| 12272416 | ATPG testing method for latch based memories, for area reduction | Balwinder Singh Soni, Avneep Kumar Goyal | 2025-04-08 |
| 12203982 | System and method for parallel testing of electronic device | Rajesh Narwal, Srinivas Dhulipalla | 2025-01-21 |