Issued Patents 2025
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12406824 | Charged particle beam device and sample observation method | Yusuke Seki, Keisuke TANUMA | 2025-09-02 |
| 12315695 | Sample holder, intermembrane distance adjustment mechanism, and charged particle beam device | Michio Hatano, Toshihiko Ogura | 2025-05-27 |
| 12265041 | Thin film damage detection function and charged particle beam device | Michio Hatano, Toshihiko Ogura | 2025-04-01 |
| 12251904 | Recording medium processing apparatus and image forming system | Takayuki Uchiyama, Masashi Matsumoto, Takumi UEGANE, Satoko MONOE | 2025-03-18 |