Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12406824 | Charged particle beam device and sample observation method | Mitsuhiro Nakamura, Keisuke TANUMA | 2025-09-02 |
| 12333718 | Method for generating model by recognizing cross-section regions in units of pixels | Yuki SAKAGUCHI, Akira Iguchi | 2025-06-17 |