Issued Patents 2025
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12360052 | Defect inspection apparatus and defect inspection method | Kenji Takubo, Koki YOSHIDA | 2025-07-15 |
| 12320781 | Joined body testing method, joined body testing device, and joined body | Ryusuke HIOKI, Yoshihaya Imamura, Chieko IMAI, Koki YOSHIDA | 2025-06-03 |
| 12188769 | Defect inspection device and defect inspection method | Koki YOSHIDA, Kenji Takubo | 2025-01-07 |