Issued Patents 2025
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12360052 | Defect inspection apparatus and defect inspection method | Takahide HATAHORI, Koki YOSHIDA | 2025-07-15 |
| 12345653 | Defect inspection apparatus | Hiroshi Horikawa | 2025-07-01 |
| 12188769 | Defect inspection device and defect inspection method | Koki YOSHIDA, Takahide HATAHORI | 2025-01-07 |