Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12237184 | Heating structure and wafer test device | Zhe Lian, Bin Zhou, Xiaoming Guo | 2025-02-25 |
| 12228603 | Wafer-level semiconductor high-voltage reliability test fixture | Zhe Lian, Jianjun Huang, Haiyang Hu | 2025-02-18 |