Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12196669 | Inspection apparatus and method of inspecting wafer | Jongmin YOON, Suhwan Park, Inkeun Baek | 2025-01-14 |
MP
Martin Priwisch
Overall (2025): #289,450 of 469,880Top 65%
1
Patents 2025