Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12196669 | Inspection apparatus and method of inspecting wafer | Martin Priwisch, Jongmin YOON, Suhwan Park | 2025-01-14 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12196669 | Inspection apparatus and method of inspecting wafer | Martin Priwisch, Jongmin YOON, Suhwan Park | 2025-01-14 |