Issued Patents 2025
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12320844 | Integrated circuit profiling and anomaly detection | Yahel DAVID, Eyal Fayneh, Shai Cohen, Yair Talker | 2025-06-03 |
| 12282058 | Integrated circuit pad failure detection | Eyal Fayneh, Shai Cohen, Yahel DAVID, Inbar WEINTROB | 2025-04-22 |
| 12241933 | Integrated circuit margin measurement for structural testing | Eyal Fayneh, Shai Cohen, Alex KHAZIN | 2025-03-04 |
| 12216976 | Efficient integrated circuit simulation and testing | Yair Talker, Eyal Fayneh, Yahel DAVID, Shai Cohen, Inbar WEINTROB | 2025-02-04 |