Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12241933 | Integrated circuit margin measurement for structural testing | Evelyn Landman, Eyal Fayneh, Shai Cohen | 2025-03-04 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12241933 | Integrated circuit margin measurement for structural testing | Evelyn Landman, Eyal Fayneh, Shai Cohen | 2025-03-04 |