Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12301990 | Deep learning model for auto-focusing microscope systems | Denis Sharoukhov, Jonathan Lee | 2025-05-13 |
| 12205360 | Defect detection system | Denis Babeshko, Vadim Pinskiy, Matthew C. Putman, Andrew Sundstrom | 2025-01-21 |