DB

Denis Babeshko

NI Nanotronics Imaging: 1 patents #10 of 15Top 70%
📍 New York, NY: #693 of 2,453 inventorsTop 30%
🗺 New York: #2,841 of 9,062 inventorsTop 35%
Overall (2025): #406,945 of 469,880Top 90%
1
Patents 2025

Issued Patents 2025

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
12205360 Defect detection system Tonislav Ivanov, Vadim Pinskiy, Matthew C. Putman, Andrew Sundstrom 2025-01-21