WY

William Yu

Micron: 2 patents #320 of 1,205Top 30%
Overall (2025): #76,308 of 469,880Top 20%
2
Patents 2025

Issued Patents 2025

Patent #TitleCo-InventorsDate
12315580 Built-in self-test circuitry Daniele Balluchi, Danilo Caraccio, Thomas T. Tangelder, Jacob S. Robertson, James G. Steele +1 more 2025-05-27
12293803 Built-in self-test burst patterns based on architecture of memory Daniele Balluchi, Chad B. Erickson, Danilo Caraccio 2025-05-06