Issued Patents 2025
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12293803 | Built-in self-test burst patterns based on architecture of memory | William Yu, Daniele Balluchi, Danilo Caraccio | 2025-05-06 |
CE
Chad B. Erickson
Overall (2025): #428,707 of 469,880Top 95%
1
Patents 2025