Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12405226 | Substrate inspection apparatus and substrate inspection method | Jangwoon Sung, Lei Tian, Hao Wang, Jiabei Zhu, Myungjun Lee +3 more | 2025-09-02 |
| 12368065 | Wafer processing apparatus | Seunghwa Hyun, Kijoo HONG, Taejoong Kim, Youngkyu Park | 2025-07-22 |