Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12315727 | Eliminating yield impact of stochastics in lithography | Nader Shamma, Richard Wise, Jengyi Yu | 2025-05-27 |
| 12293919 | Alternating etch and passivation process | Seongjun Heo, Jengyi Yu, Chen-Wei Liang, Alan J. Jensen | 2025-05-06 |