Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12422376 | Imaging reflectometry for inline screening | John Robinson, Shifang Li, Mike Von Den Hoff, Justin Lach, Barry Saville +5 more | 2025-09-23 |
| 12209854 | Methods and systems for measurement of tilt and overlay of a structure | Min-Yeong Moon | 2025-01-28 |