Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12422376 | Imaging reflectometry for inline screening | Stilian Ivanov Pandev, Shifang Li, Mike Von Den Hoff, Justin Lach, Barry Saville +5 more | 2025-09-23 |
| 12332182 | System for automatic diagnostics and monitoring of semiconductor defect die screening performance through overlay of defect and electrical test data | David W. Price, Robert J. Rathert, Chet V. Lenox, Oreste Donzella, Justin Lach | 2025-06-17 |