Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12354831 | Pattern inspection apparatus and pattern inspection method | Masataka Shiratsuchi, Tadayuki Sugimori | 2025-07-08 |
| 12288666 | Multiple electron beam image acquisition method, multiple electron beam image acquisition apparatus, and multiple electron beam inspection apparatus | Koichi Ishii | 2025-04-29 |