Issued Patents 2025
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12394406 | Paralinguistic information estimation model learning apparatus, paralinguistic information estimation apparatus, and program | Hosana KAMIYAMA, Satoshi KOBASHIKAWA | 2025-08-19 |
| 12339241 | Multiple secondary electron beam alignment method, multiple secondary electron beam alignment apparatus, and electron beam inspection apparatus | Koichi Ishii | 2025-06-24 |
| 12308202 | Multi-electron beam inspection apparatus, multipole array control method, and multi-electron beam inspection method | Yuichi Maekawa | 2025-05-20 |
| 12261015 | Electron beam inspection apparatus | Takahiro Murata | 2025-03-25 |