GL

Gian Francesco Lorusso

IV Imec Vzw: 1 patents #32 of 162Top 20%
KL Katholieke Universiteit Leuven: 1 patents #8 of 83Top 10%
📍 Overijse, CA: #1 of 1 inventorsTop 100%
Overall (2025): #381,613 of 469,880Top 85%
1
Patents 2025

Issued Patents 2025

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
12278086 Pattern height metrology using an e-beam system Mohamed Saib, Alain Moussa, Anne-Laure Charley, Danilo De Simone, Joren Severi 2025-04-15