AC

Anne-Laure Charley

IV Imec Vzw: 1 patents #32 of 162Top 20%
KL Katholieke Universiteit Leuven: 1 patents #8 of 83Top 10%
📍 Hamme-Mille, BE: #1 of 3 inventorsTop 35%
Overall (2025): #455,314 of 469,880Top 100%
1
Patents 2025

Issued Patents 2025

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
12278086 Pattern height metrology using an e-beam system Gian Francesco Lorusso, Mohamed Saib, Alain Moussa, Danilo De Simone, Joren Severi 2025-04-15