Issued Patents 2025
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12392733 | Combined ocd and photoreflectance method and system | Gilad Barak | 2025-08-19 |
| 12372473 | Accurate Raman spectroscopy | Eyal Hollander, Gilad Barak, Elad Schleifer, Amir Shayari | 2025-07-29 |
| 12366533 | Hybrid metrology method and system | Gilad Barak, Yanir Hainick | 2025-07-22 |
| 12359968 | Systems and methods for optical metrology | Eyal Hollander, Elad Schleifer, Gilad Barak | 2025-07-15 |
| 12298182 | Optical technique for material characterization | Gilad Barak | 2025-05-13 |