Issued Patents 2025
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12392733 | Combined ocd and photoreflectance method and system | Yonatan Oren | 2025-08-19 |
| 12372473 | Accurate Raman spectroscopy | Eyal Hollander, Elad Schleifer, Yonatan Oren, Amir Shayari | 2025-07-29 |
| 12366533 | Hybrid metrology method and system | Yanir Hainick, Yonatan Oren | 2025-07-22 |
| 12359968 | Systems and methods for optical metrology | Yonatan Oren, Eyal Hollander, Elad Schleifer | 2025-07-15 |
| 12360462 | Optical metrology system and method | Amir Shayari | 2025-07-15 |
| 12298182 | Optical technique for material characterization | Yonatan Oren | 2025-05-13 |
| 12196691 | X-ray based measurements in patterned structure | — | 2025-01-14 |