Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12360063 | System and method for measuring a sample by x-ray reflectance scatterometry | Heath A. Pois, David A. Reed, Bruno W. Schueler, Jeffrey T. Fanton | 2025-07-15 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12360063 | System and method for measuring a sample by x-ray reflectance scatterometry | Heath A. Pois, David A. Reed, Bruno W. Schueler, Jeffrey T. Fanton | 2025-07-15 |