Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12360063 | System and method for measuring a sample by x-ray reflectance scatterometry | David A. Reed, Bruno W. Schueler, Rodney Smedt, Jeffrey T. Fanton | 2025-07-15 |
| 12281893 | Characterizing and measuring in small boxes using XPS with multiple measurements | Wei Ti Lee, Laxmi WARAD, Dmitry Kislitsyn, Parker Lund, Benny Tseng +2 more | 2025-04-22 |