Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12321102 | Machine and deep learning methods for spectra-based metrology and process control | Barak Bringoltz, Noam Tal, Shay Yogev, Boaz STURLESI, Oded Cohen | 2025-06-03 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12321102 | Machine and deep learning methods for spectra-based metrology and process control | Barak Bringoltz, Noam Tal, Shay Yogev, Boaz STURLESI, Oded Cohen | 2025-06-03 |