Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12243712 | Method and system for determining a charged particle beam exposure for a local pattern density | Akira Fujimura, Nagesh Shirali, Abhishek Shendre, William E. Guthrie, Ryan Pearman | 2025-03-04 |