Issued Patents 2025
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12387029 | Computing parasitic values for semiconductor designs | Akira Fujimura, Donald Oriordan | 2025-08-12 |
| 12372864 | Methods and systems to determine shapes for semiconductor or flat panel display fabrication | Akira Fujimura, Donald Oriordan | 2025-07-29 |
| 12340164 | Methods and systems for reticle enhancement technology of a design pattern to be manufactured on a substrate | Akira Fujimura, P. Jeffrey Ungar | 2025-06-24 |
| 12287567 | Method and system for reticle enhancement technology | Akira Fujimura, Ajay Baranwal | 2025-04-29 |
| 12248242 | Methods and systems for reticle enhancement technology of a design pattern to be manufactured on a substrate | Akira Fujimura, P. Jeffrey Ungar | 2025-03-11 |
| 12243712 | Method and system for determining a charged particle beam exposure for a local pattern density | Akira Fujimura, Harold Robert Zable, Abhishek Shendre, William E. Guthrie, Ryan Pearman | 2025-03-04 |